Patent · US Expired

Device interconnection

US6870263B1 · kind B1 · utility

8Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1998
Grant dateMar 22, 2005
Priority date
Expiry dateMar 31, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A conductor for interconnecting integrated circuit components having improved reliability. The conductor includes a liner surrounding at least three surfaces of the conductor, producing a low textured conductor. It has been found that low textured conductor results in improved electromigration lifetime.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.