Applied Precision, Inc.
🏢 View company profile →40Patents
14Active
40Granted
44Portfolio score
Filing activity: May 21, 1986 → Oct 13, 2011 · 9 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6710798B1 | Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card | Physics | 136 | Expired |
| US4710167A | Implantable device for chronically injecting a substance, in particular a therapeutant | Human Necessities | 132 | Expired |
| US4918374A | Method and apparatus for inspecting integrated circuit probe cards | Physics | 107 | Expired |
| US4718894A | Manually actuated, implantable device to sequentially feed doses of a substance, in particular a therapeutant | Human Necessities | 88 | Expired |
| US5812310A | Orthogonal high accuracy microscope stage | Physics | 30 | Expired |
| US7231081B2 | Stereoscopic three-dimensional metrology system and method | Electricity | 24 | Expired |
| US7141801B2 | System and method of illuminating living cells for imaging | Physics | 23 | Expired |
| US7408176B2 | System and method employing photokinetic techniques in cell biology imaging applications | Physics | 14 | Expired |
| US6414477B1 | Method for optimizing probe card analysis and scrub mark analysis data | Physics | 13 | Expired |
| US5508629A | Method and apparatus for inspecting integrated circuit probe cards | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5899437A | Cam actuated valve | Mechanical Engineering; Lighting; Heating | 12 | Expired |
| US5060371A | Method of making probe cards | Emerging Cross-Sectional Technologies | 10 | Expired |
| US8362409B2 | System and method for continuous, asynchronous autofocus of optical instruments | Physics | 10 | Active |
| US7170307B2 | System and method of mitigating effects of component deflection in a probe card analyzer | Physics | 9 | Expired |
| US5684628A | Orthogonal motion microscope stage | Physics | 9 | Expired |
| US7062091B2 | Coordinate calibration for scanning systems | Physics | 9 | Expired |
| US6781753B2 | Z-axis frame for a high accuracy orthogonal motion stage | Physics | 8 | Expired |
| US6862363B2 | Image metrics in the statistical analysis of DNA microarray data | Physics | 7 | Expired |
| US7770402B2 | Thermally efficient CCD camera housing | Electricity | 7 | Active |
| US8570650B2 | Method and system for fast three-dimensional structured-illumination-microscopy imaging | Physics | 7 | Active |
| US6806595B2 | Low backlash linear actuator | Mechanical Engineering; Lighting; Heating | 6 | Expired |
| US6621262B2 | Method for optimizing probe card analysis and scrub mark analysis data | Physics | 5 | Expired |
| US5831443A | Probe card array check plate with transition zones | Physics | 5 | Expired |
| US6986211B2 | System and method of planar positioning | Physics | 5 | Expired |
| US5744884A | Liner motion micropositioning apparatus and method | Mechanical Engineering; Lighting; Heating | 3 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.