Patent assignee · US · COMPANY

Deposition Sciences, Inc.

17Patents
1Active
17Granted
36Portfolio score

Filing activity: Nov 21, 1988 → Oct 27, 2008 · 1 expiring within 5 years

Most-cited patents

PatentTitleAreaCited byStatus
US5164858A Multi-spectral filter Physics 74 Expired
US5616224A Apparatus for reducing the intensity and frequency of arcs which occur during a sputtering process Electricity 39 Expired
US6107564A Solar cell cover and coating Emerging Cross-Sectional Technologies 39 Expired
US6197428A Gemstones and decorative objects comprising a substrate and an optical interference film Performing Operations; Transporting 36 Expired
US5234769A Wear resistant transparent dielectric coatings Emerging Cross-Sectional Technologies 34 Expired
US6331914A Optical interference coating capable of withstanding severe temperature environments Electricity 26 Expired
US4879140A Method for making pigment flakes Chemistry; Metallurgy 25 Expired
US5849162A Sputtering device and method for reactive for reactive sputtering Electricity 20 Expired
US5923471A Optical interference coating capable of withstanding severe temperature environments Electricity 18 Expired
US5714009A Apparatus for generating large distributed plasmas by means of plasma-guided microwave power Electricity 17 Expired
US6485616B1 System and method for coating substrates with improved capacity and uniformity Chemistry; Metallurgy 10 Expired
US7232506B2 System and method for feedforward control in thin film coating processes Chemistry; Metallurgy 4 Expired
US7176606B2 Lamp that emits colored light Electricity 3 Expired
US7238262B1 System and method of coating substrates and assembling devices having coated elements Emerging Cross-Sectional Technologies 2 Expired
US6402902B1 Apparatus and method for a reliable return current path for sputtering processes Electricity 1 Expired
US8133361B2 Thin film coating system and method Performing Operations; Transporting 0 Active
US7008518B2 Method and apparatus for monitoring optical characteristics of thin films in a deposition process Physics 0 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.