Patent assignee · US · COMPANY

VSLI Technology, Inc.

17Patents
0Active
17Granted
33Portfolio score

Filing activity: Jan 19, 1993 → Jul 12, 2001

Most-cited patents

PatentTitleAreaCited byStatus
US6099584A System to fix post-layout timing and design rules violations Physics 209 Expired
US6198635A Interconnect layout pattern for integrated circuit packages and the like Electricity 105 Expired
US6327650A Pipelined multiprocessing with upstream processor concurrently writing to local register and to register of downstream processor Physics 67 Expired
US6174803A Integrated circuit device interconnection techniques Electricity 60 Expired
US5974245A Method and apparatus for making integrated circuits by inserting buffers into a netlist Physics 49 Expired
US6139428A Conditioning ring for use in a chemical mechanical polishing machine Performing Operations; Transporting 34 Expired
US6134641A Method of and system for allowing a computer system to access cacheable memory in a non-cacheable manner Physics 30 Expired
US6069495A High-speed logic embodied differential dynamic CMOS true single phase clock latches and flip-flops with single transistor clock latches Electricity 23 Expired
US6101171A Slot by slot PS/CS switching apparatus within the personal handy phone system Electricity 15 Expired
US6086621A Logic synthesis constraints allocation automating the concurrent engineering flows Physics 15 Expired
US6067027A Low power plug-in card removal detection Physics 13 Expired
US5976741A Methods for determining illumination exposure dosage Physics 13 Expired
US6347979B1 Slurry dispensing carrier ring Performing Operations; Transporting 11 Expired
US6215129A Via alignment, etch completion, and critical dimension measurement method and structure Emerging Cross-Sectional Technologies 7 Expired
US6490329B2 Device and method for generating clock signals from a single reference frequency signal and for synchronizing data signals with a generated clock Electricity 6 Expired
US5348902A Method of designing cells applicable to different design automation systems Physics 5 Expired
US5968690A Thin film thickness and optimal focus measuring using reflectivity Physics 0 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.