Ashesh Parikh
16Patents
4h-index
23Co-inventors
56Inventor score
Filing activity: Dec 23, 2004 → Jan 15, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7687308B2 | Method for fabricating carbon nanotube transistors on a silicon or SOI substrate | Emerging Cross-Sectional Technologies | 15 | Active |
| US7772059B2 | Method for fabricating graphene transistors on a silicon or SOI substrate | Electricity | 11 | Active |
| US9496313B2 | CMOS-based thermopile with reduced thermal conductance | Electricity | 4 | Active |
| US7562333B2 | Method and process for generating an optical proximity correction model based on layout density | Physics | 4 | Active |
| US7985990B2 | Transistor layout for manufacturing process control | Electricity | 3 | Active |
| US8394681B2 | Transistor layout for manufacturing process control | Electricity | 3 | Active |
| US8793626B2 | Computational lithography with feature upsizing | Physics | 1 | Active |
| US7458058B2 | Verifying a process margin of a mask pattern using intermediate stage models | Electricity | 1 | Active |
| US9665675B2 | Method to improve transistor matching | Emerging Cross-Sectional Technologies | 1 | Active |
| US10339251B2 | Method to improve transistor matching | Emerging Cross-Sectional Technologies | 1 | Active |
| US8806388B2 | Extraction of imaging parameters for computational lithography using a data weighting algorithm | Physics | 1 | Active |
| US9853086B2 | CMOS-based thermopile with reduced thermal conductance | Electricity | 1 | Active |
| US7842955B2 | Carbon nanotube transistors on a silicon or SOI substrate | Emerging Cross-Sectional Technologies | 1 | Active |
| US8015513B2 | OPC models generated from 2D high frequency test patterns | Physics | 0 | Active |
| US12020124B2 | Selecting optimum primary and secondary parameters to calibrate and generate an unbiased forecasting model | Physics | 0 | Active |
| US11775852B2 | Network optimization | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.