Azeddine Zerrade
13Patents
2h-index
14Co-inventors
47Inventor score
Filing activity: Oct 14, 2003 → Apr 20, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7767365B2 | Methods for forming and cleaning photolithography reticles | Physics | 3 | Active |
| US11300871B2 | Extreme ultraviolet mask absorber materials | Physics | 2 | Active |
| US7147974B2 | Methods for converting reticle configurations | Physics | 2 | Expired |
| US11537040B2 | Extreme ultraviolet mask blank hard mask materials | Physics | 0 | Active |
| US11815809B2 | Extreme ultraviolet mask absorber materials | General | 0 | Revoked |
| US11556053B2 | Extreme ultraviolet mask blank hard mask materials | Physics | 0 | Active |
| US11454876B2 | EUV mask blank absorber defect reduction | Physics | 0 | Active |
| US11640109B2 | Extreme ultraviolet mask absorber materials | Physics | 0 | Active |
| US11789358B2 | Extreme ultraviolet mask blank defect reduction | Physics | 0 | Active |
| US11669008B2 | Extreme ultraviolet mask blank defect reduction methods | Physics | 0 | Active |
| US11630385B2 | Extreme ultraviolet mask absorber materials | Physics | 0 | Active |
| US11860533B2 | Extreme ultraviolet mask absorber materials | Physics | 0 | Active |
| US7592105B2 | Methods for converting reticle configurations and methods for modifying reticles | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.