Bryan Tracy
12Patents
6h-index
20Co-inventors
58Inventor score
Filing activity: Jun 5, 1995 → Dec 10, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5770519A | Copper reservoir for reducing electromigration effects associated with a conductive via in a semiconductor device | Electricity | 35 | Expired |
| US5847821A | Use of fiducial marks for improved blank wafer defect review | Performing Operations; Transporting | 29 | Expired |
| US5882738A | Apparatus and method to improve electromigration performance by use of amorphous barrier layer | Emerging Cross-Sectional Technologies | 22 | Expired |
| US5713667A | Temperature sensing probe for microthermometry | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5639691A | Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device | Emerging Cross-Sectional Technologies | 11 | Expired |
| US6011619A | Semiconductor wafer optical scanning system and method using swath-area defect limitation | Physics | 10 | Expired |
| US5646448A | Copper pellet for reducing electromigration effects associated with a conductive via in a semiconductor device | Emerging Cross-Sectional Technologies | 6 | Expired |
| US5864199A | Electron beam emitting tungsten filament | Electricity | 5 | Expired |
| US5727978A | Method of forming electron beam emitting tungsten filament | Electricity | 4 | Expired |
| US6812049B1 | Method and system for performing failure analysis on a multilayer silicon-on-insulator (SOI) device | Physics | 4 | Expired |
| US6770512B1 | Method and system for using TMAH for staining copper silicon on insulator semiconductor device cross sections | Electricity | 2 | Expired |
| US6534869B2 | Method for reducing stress-induced voids for 0.25 &mgr;m micron and smaller semiconductor chip technology by annealing interconnect lines prior to ILD deposition and semiconductor chip made thereby | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.