Inventor · Mountain View, CA, US

Bulent Dervisoglu

19Patents
12h-index
5Co-inventors
71Inventor score

Filing activity: Aug 10, 1990 → Feb 14, 2011

Most-cited inventions

PatentTitleAreaCited byStatus
US5257223A Flip-flop circuit with controllable copying between slave and scan latches Electricity 106 Expired
US6594802B1 Method and apparatus for providing optimized access to circuits for debug, programming, and test Physics 89 Expired
US6631504B2 Hierarchical test circuit structure for chips with multiple circuit blocks Physics 80 Expired
US6687865B1 On-chip service processor for test and debug of integrated circuits Physics 69 Expired
US6886121B2 Hierarchical test circuit structure for chips with multiple circuit blocks Physics 41 Expired
US7197681B2 Accelerated scan circuitry and method for reducing scan test data volume and execution time Physics 25 Expired
US7890899B2 Variable clocked scan test improvements Physics 22 Active
US7181705B2 Hierarchical test circuit structure for chips with multiple circuit blocks Physics 21 Expired
US7353470B2 Variable clocked scan test improvements Physics 20 Active
US7188286B2 Accelerated scan circuitry and method for reducing scan test data volume and execution time Physics 19 Expired
US5068881A Scannable register with delay test capability Physics 18 Expired
US7200784B2 Accelerated scan circuitry and method for reducing scan test data volume and execution time Physics 18 Expired
US6964001B2 On-chip service processor Physics 8 Expired
US7752515B2 Accelerated scan circuitry and method for reducing scan test data volume and execution time Physics 6 Active
US7836371B2 On-chip service processor Physics 4 Active
US7080301B2 On-chip service processor Physics 4 Expired
US8239716B2 On-chip service processor Physics 2 Active
US8996938B2 On-chip service processor Physics 1 Active
US6816996B2 Hierarchical test circuit structure for chips with multiple circuit blocks General 0 Revoked

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.