Inventor · San Jose, CA, US

Christopher Sears

29Patents
5h-index
33Co-inventors
65Inventor score

Filing activity: Jul 16, 2010 → May 31, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US8698094B1 Permanent magnet lens array Electricity 13 Active
US8513619B1 Non-planar extractor structure for electron source Electricity 12 Active
US8455838B2 Multiple-column electron beam apparatus and methods Electricity 10 Active
US9805910B1 Automated SEM nanoprobe tool Electricity 6 Active
US8421030B2 Charged-particle energy analyzer Electricity 5 Active
US10748739B2 Deflection array apparatus for multi-electron beam system Electricity 4 Active
US10096447B1 Electron beam apparatus with high resolutions Electricity 3 Active
US8633457B2 Background reduction system including louver Electricity 3 Active
US11056312B1 Micro stigmator array for multi electron beam system Electricity 3 Active
US9513230B2 Apparatus and method for optical inspection, magnetic field and height mapping Electricity 2 Active
US10276346B1 Particle beam inspector with independently-controllable beams Electricity 2 Active
US10090131B2 Method and system for aberration correction in an electron beam system Electricity 2 Active
US10056224B2 Method and system for edge-of-wafer inspection and review Electricity 2 Active
US9443693B2 Notched magnetic lens for improved sample access in an SEM Electricity 2 Active
US8658973B2 Auger elemental identification algorithm Physics 2 Active
US8921782B2 Tilt-imaging scanning electron microscope Electricity 1 Active
US10964522B2 High resolution electron energy analyzer Electricity 1 Active
US9934933B1 Extractor electrode for electron source Electricity 1 Active
US10354832B2 Multi-column scanning electron microscopy system Electricity 1 Active
US11037753B2 Magnetically microfocused electron emission source Electricity 0 Active
US12165838B2 Joint electron-optical columns for flood-charging and image-forming in voltage contrast wafer inspections Electricity 0 Active
US12165831B2 Method and system of image-forming multi-electron beams Electricity 0 Active
US9881764B2 Heat-spreading blanking system for high throughput electron beam apparatus Electricity 0 Active
US10770258B2 Method and system for edge-of-wafer inspection and review Electricity 0 Active
US10224177B2 Method and system for aberration correction in an electron beam system Electricity 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.