Erwin Ruderer
7Patents
4h-index
12Co-inventors
46Inventor score
Filing activity: Mar 24, 2003 → Jan 6, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7930660B2 | Measurement structure in a standard cell for controlling process parameters during manufacturing of an integrated circuit | Physics | 84 | Active |
| US7768054B2 | Semiconductor component with integrated capacitance structure and method for fabrication thereof | Electricity | 20 | Expired |
| US8138539B2 | Semiconductor devices and methods of manufacture thereof | Electricity | 10 | Active |
| US7458053B2 | Method for generating fill and cheese structures | Physics | 8 | Active |
| US7655563B2 | Method for preventing the formation of dentrites in a semiconductor | Electricity | 1 | Active |
| US8569820B2 | Capacitor having a plurality of parallel conductive members | Electricity | 1 | Active |
| US7675173B2 | Manufacturing semiconductor circuit, corresponding semiconductor circuit, and associated design process | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.