Gokhan Percin
12Patents
9h-index
17Co-inventors
65Inventor score
Filing activity: Jun 15, 1998 → Mar 13, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8222065B1 | Method and system for forming a capacitive micromachined ultrasonic transducer | Electricity | 81 | Active |
| US8563345B2 | Integration of structurally-stable isolated capacitive micromachined ultrasonic transducer (CMUT) array cells and array elements | Electricity | 65 | Active |
| US6474786B2 | Micromachined two-dimensional array droplet ejectors | Performing Operations; Transporting | 47 | Expired |
| US6445109B2 | Micromachined two dimensional array of piezoelectrically actuated flextensional transducers | Emerging Cross-Sectional Technologies | 42 | Expired |
| US6291927A | Micromachined two dimensional array of piezoelectrically actuated flextensional transducers | Emerging Cross-Sectional Technologies | 35 | Expired |
| US7600212B2 | Method of compensating photomask data for the effects of etch and lithography processes | Physics | 31 | Active |
| US8279409B1 | System and method for calibrating a lithography model | Physics | 27 | Active |
| US7444615B2 | Calibration on wafer sweet spots | Physics | 13 | Active |
| US7588868B2 | Method and system for reducing the impact of across-wafer variations on critical dimension measurements | Physics | 11 | Active |
| US7392502B2 | Method for real time monitoring and verifying optical proximity correction model and method | Physics | 9 | Expired |
| US7536670B2 | Method for verifying and choosing lithography model | Physics | 6 | Expired |
| US7224437B2 | Method for measuring and verifying stepper illumination | Physics | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.