Inventor · Tokyo, JP

Hidemitsu Mori

13Patents
6h-index
12Co-inventors
59Inventor score

Filing activity: Nov 8, 1996 → Oct 27, 2009

Most-cited inventions

PatentTitleAreaCited byStatus
US8148774B2 Method of fabricating semiconductor device with a high breakdown voltage between neighboring wells Electricity 116 Active
US6030894A Method for manufacturing a semiconductor device having contact plug made of Si/SiGe/Si Electricity 76 Expired
US5808365A Semiconductor device and method of manufacturing the same Electricity 31 Expired
US5895948A Semiconductor device and fabrication process thereof Electricity 20 Expired
US5909059A Semiconductor device having contact plug and method for manufacturing the same Electricity 19 Expired
US5838036A Semiconductor memory device capable of realizing a minimum memory cell area approximate to a theoretical value Electricity 13 Expired
US6162676A Method of making a semiconductor device with an etching stopper Electricity 6 Expired
US6127231A Method of making transistors in an IC including memory cells Electricity 6 Expired
US6534358B2 Method of fabricating semiconductor device having ferroelectric capacitor Electricity 6 Expired
US6730955B2 Semiconductor memory and process for fabricating the same Electricity 6 Expired
US6384440B1 Ferroelectric memory including ferroelectric capacitor, one of whose electrodes is connected to metal silicide film Electricity 4 Expired
US6887752B2 Semiconductor memory and process for fabricating the same Electricity 3 Expired
US5946570A Process for fabricating semiconductor device having semiconductor layers epitaxially grown from active areas without short-circuit on field insulating layer Electricity 3 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.