Hiroyasu Shichi
77Patents
16h-index
59Co-inventors
87Inventor score
Filing activity: May 20, 1985 → Jun 12, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8779400B2 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Electricity | 88 | Active |
| US6664552B2 | Method and apparatus for specimen fabrication | Electricity | 73 | Expired |
| US5481109A | Surface analysis method and apparatus for carrying out the same | Electricity | 72 | Expired |
| US6781125B2 | Method and apparatus for processing a micro sample | Electricity | 63 | Expired |
| US6717156B2 | Beam as well as method and equipment for specimen fabrication | Electricity | 56 | Expired |
| US6927391B2 | Method and apparatus for processing a micro sample | Electricity | 39 | Expired |
| US5877498A | Method and apparatus for X-ray analyses | Electricity | 32 | Expired |
| US4687938A | Ion source | Electricity | 32 | Expired |
| US6858851B2 | Apparatus for specimen fabrication and method for specimen fabrication | Electricity | 30 | Expired |
| US7205554B2 | Method and apparatus for processing a micro sample | Electricity | 23 | Expired |
| US7205560B2 | Method and apparatus for processing a micro sample | Electricity | 21 | Expired |
| US5714757A | Surface analyzing method and its apparatus | Electricity | 18 | Expired |
| US7550750B2 | Method and apparatus for processing a micro sample | Electricity | 18 | Active |
| US7465945B2 | Method and apparatus for processing a micro sample | Electricity | 17 | Active |
| US7268356B2 | Method and apparatus for specimen fabrication | Electricity | 16 | Expired |
| US6794663B2 | Method and apparatus for specimen fabrication | Electricity | 16 | Expired |
| US4774433A | Apparatus for generating metal ions | Electricity | 16 | Expired |
| US7470918B2 | Method and apparatus for processing a micro sample | Electricity | 15 | Active |
| US7700931B2 | Ion beam processing apparatus | Electricity | 13 | Active |
| US5594246A | Method and apparatus for x-ray analyses | Electricity | 12 | Expired |
| US7888639B2 | Method and apparatus for processing a micro sample | Electricity | 11 | Active |
| US8115184B2 | Gas field ion source, charged particle microscope, and apparatus | Electricity | 11 | Active |
| US8263943B2 | Ion beam device | Electricity | 11 | Active |
| US7326942B2 | Ion beam system and machining method | Electricity | 10 | Active |
| US8481980B2 | Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.