Inventor · Hsinchu, TW

I-Ching Li

17Patents
1h-index
30Co-inventors
50Inventor score

Filing activity: Dec 23, 2013 → Jul 3, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US11852465B2 Wafer inspection method and apparatus thereof Physics 1 Active
US11041255B2 Semi-insulating silicon carbide crystalline ingot having a resistivity larger than 10∧7 Ohm-cm and manufacturing method therefor Chemistry; Metallurgy 0 Active
US11859965B2 Material analysis method Physics 0 Active
US11923422B2 Semiconductor device Electricity 0 Active
US11377752B2 Mono-crystalline silicon growth method Emerging Cross-Sectional Technologies 0 Active
US10347481B2 Silicon carbide wafer and method for production thereof Electricity 0 Active
US10297702B2 Polycrystalline silicon column and polycrystalline silicon wafer Emerging Cross-Sectional Technologies 0 Active
US10825940B2 Polycrystalline silicon column and polycrystalline silicon wafer Emerging Cross-Sectional Technologies 0 Active
US12044631B2 Wafer surface defect inspection method and apparatus thereof Physics 0 Active
US11708642B2 Mono-crystalline silicon growth apparatus Emerging Cross-Sectional Technologies 0 Active
US11326272B2 Mono-crystalline silicon growth apparatus Emerging Cross-Sectional Technologies 0 Active
US9903043B2 Crucible assembly and method of manufacturing crystalline silicon ingot by use of such crucible assembly Emerging Cross-Sectional Technologies 0 Active
US12076677B2 Method for collecting dust from single crystal growth system Performing Operations; Transporting 0 Active
US9337375B2 Seed used for crystalline silicon ingot casting Emerging Cross-Sectional Technologies 0 Active
US9708727B2 Stirring apparatus of ingot casting furnace Emerging Cross-Sectional Technologies 0 Active
US10053797B2 Crystal growth apparatus and thermal insulation cover of the same Emerging Cross-Sectional Technologies 0 Active
US11845030B2 Method for collecting dust from single crystal growth system and dust collecting system thereof Performing Operations; Transporting 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.