Ido Dolev
11Patents
2h-index
16Co-inventors
47Inventor score
Filing activity: May 12, 2009 → Nov 4, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9535014B1 | Systems and methods for inspecting an object | Physics | 4 | Active |
| US8724882B2 | Mapping variations of a surface | Physics | 2 | Active |
| US8228601B2 | Scanning microscopy using inhomogeneous polarization | Physics | 2 | Active |
| US9354212B2 | Inspection having a segmented pupil | Physics | 1 | Active |
| US10481101B2 | Asymmetrical magnification inspection system and illumination module | Physics | 1 | Active |
| US10928739B2 | Method of measuring misregistration of semiconductor devices | Electricity | 0 | Active |
| US11226566B2 | Method of measuring misregistration of semiconductor devices | Electricity | 0 | Active |
| US11713959B2 | Overlay metrology using spectroscopic phase | Physics | 0 | Active |
| US9846128B2 | Inspection system and a method for evaluating an exit pupil of an inspection system | Physics | 0 | Active |
| US11029253B2 | Computerized method for configuring an inspection system, computer program product and an inspection system | Physics | 0 | Active |
| US11967535B2 | On-product overlay targets | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.