James M. Larnerd
12Patents
4h-index
14Co-inventors
57Inventor score
Filing activity: Oct 6, 1987 → Jan 18, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7348677B2 | Method of providing printed circuit board with conductive holes and board resulting therefrom | Electricity | 14 | Active |
| US7211289B2 | Method of making multilayered printed circuit board with filled conductive holes | Electricity | 12 | Expired |
| US4869418A | Solder leveling method and apparatus | Electricity | 11 | Expired |
| US4799616A | Solder leveling method and apparatus | Electricity | 8 | Expired |
| US7157646B2 | Circuitized substrate with split conductive layer, method of making same, electrical assembly utilizing same, and information handling system utilizing same | Emerging Cross-Sectional Technologies | 4 | Expired |
| US4979862A | Automatic loading mechanism | Electricity | 3 | Expired |
| US6105246A | Method of making a circuit board having burr free castellated plated through holes | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7377033B2 | Method of making circuitized substrate with split conductive layer and information handling system utilizing same | Emerging Cross-Sectional Technologies | 1 | Active |
| US7157647B2 | Circuitized substrate with filled isolation border, method of making same, electrical assembly utilizing same, and information handling system utilizing same | Emerging Cross-Sectional Technologies | 1 | Expired |
| US6483046B1 | Circuit board having burr free castellated plated through holes | Emerging Cross-Sectional Technologies | 1 | Expired |
| US7814649B2 | Method of making circuitized substrate with filled isolation border | Emerging Cross-Sectional Technologies | 0 | Active |
| US7491896B2 | Information handling system utilizing circuitized substrate with split conductive layer | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.