Jeffrey B. Bindell
12Patents
7h-index
19Co-inventors
63Inventor score
Filing activity: Feb 11, 1977 → Aug 28, 2001
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6250143A | Method of mapping a surface using a probe for stylus nanoprofilometry having a non-circular cross-section | Emerging Cross-Sectional Technologies | 34 | Expired |
| US4107835A | Fabrication of semiconductive devices | Electricity | 20 | Expired |
| US4111783A | Triode sputtering system | Chemistry; Metallurgy | 13 | Expired |
| US5804460A | Linewidth metrology of integrated circuit structures | Emerging Cross-Sectional Technologies | 12 | Expired |
| US4948407A | Proton exchange method of forming waveguides in LiNbO.sub.3 | Physics | 10 | Expired |
| US6297503A | Method of detecting semiconductor defects | Electricity | 7 | Expired |
| US6362475B1 | Scanning electron microscope/energy dispersive spectroscopy sample preparation method and sample produced thereby | Electricity | 7 | Expired |
| US6405584B1 | Probe for scanning probe microscopy and related methods | Emerging Cross-Sectional Technologies | 7 | Expired |
| US6727720B2 | Probe having a microstylet | Emerging Cross-Sectional Technologies | 6 | Expired |
| US6178653A | Probe tip locator | Emerging Cross-Sectional Technologies | 5 | Expired |
| US5194117A | Lithium niobate etchant | Electricity | 3 | Expired |
| US6425189B1 | Probe tip locator having improved marker arrangement for reduced bit encoding error | Emerging Cross-Sectional Technologies | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.