John J. Hench
36Patents
10h-index
46Co-inventors
75Inventor score
Filing activity: Nov 10, 2000 → Apr 19, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6970560B1 | Method and apparatus for impairment diagnosis in communication systems | Electricity | 45 | Expired |
| US6870901B1 | Design and architecture of an impairment diagnosis system for use in communications systems | Electricity | 41 | Expired |
| US6978015B1 | Method and apparatus for cooperative diagnosis of impairments and mitigation of disturbers in communication systems | Electricity | 25 | Expired |
| US9518916B1 | Compressive sensing for metrology | Physics | 23 | Active |
| US7716003B1 | Model-based measurement of semiconductor device features with feed forward use of data for dimensionality reduction | Physics | 23 | Active |
| US10324050B2 | Measurement system optimization for X-ray based metrology | Physics | 20 | Active |
| US9494535B2 | Scatterometry-based imaging and critical dimension metrology | Electricity | 19 | Active |
| US7796544B2 | Method and system for providing an analog front end for multiline transmission in communication systems | Electricity | 16 | Active |
| US10775323B2 | Full beam metrology for X-ray scatterometry systems | Physics | 12 | Active |
| US8798966B1 | Measuring critical dimensions of a semiconductor structure | Electricity | 11 | Active |
| US8108328B2 | Neural network based hermite interpolator for scatterometry parameter estimation | Physics | 8 | Active |
| US7053705B2 | Mixed-mode (current-voltage) audio amplifier | Electricity | 8 | Expired |
| US9846132B2 | Small-angle scattering X-ray metrology systems and methods | Physics | 7 | Active |
| US8666703B2 | Method for automated determination of an optimally parameterized scatterometry model | Physics | 6 | Active |
| US10481111B2 | Calibration of a small angle X-ray scatterometry based metrology system | Physics | 6 | Active |
| US7602509B1 | Method for selecting optical configuration for high-precision scatterometric measurement | Physics | 5 | Active |
| US7826072B1 | Method for optimizing the configuration of a scatterometry measurement system | Physics | 4 | Active |
| US10794839B2 | Visualization of three-dimensional semiconductor structures | Electricity | 3 | Active |
| US10325004B1 | Method of optimizing an optical parametric model for structural analysis using optical critical dimension (OCD) metrology | Physics | 3 | Active |
| US7864692B1 | Method and apparatus for the prediction and optimization in impaired communication systems | Electricity | 3 | Expired |
| US10545104B2 | Computationally efficient X-ray based overlay measurement | Physics | 3 | Active |
| US8381140B2 | Wide process range library for metrology | Electricity | 2 | Active |
| US11099137B2 | Visualization of three-dimensional semiconductor structures | Electricity | 2 | Active |
| US11073487B2 | Methods and systems for characterization of an x-ray beam with high spatial resolution | Electricity | 2 | Active |
| US10983227B2 | On-device metrology using target decomposition | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.