Inventor · Taichung, TW

Jui-Long Chen

12Patents

3h-index

19Co-inventors

49Inventor score

Filing activity: Jul 8, 2009 → Apr 24, 2017

Most-cited inventions

Patent	Title	Area	Cited by	Status
US10161965B2	Method of test probe alignment control	Electricity	6	Active
US8082055B2	Method for a bin ratio forecast at new tape out stage	Physics	5	Active
US8627251B2	Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes	Electricity	5	Active
US8938698B2	Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes	Electricity	2	Active
US8942840B2	Auto device skew manufacturing	Emerging Cross-Sectional Technologies	2	Active
US9000798B2	Method of test probe alignment control	Electricity	2	Active
US8406912B2	System and method for data mining and feature tracking for fab-wide prediction and control	Emerging Cross-Sectional Technologies	2	Active
US9158867B2	2D/3D analysis for abnormal tools and stages diagnosis	Physics	1	Active
US8391999B2	Auto device skew manufacturing	Emerging Cross-Sectional Technologies	1	Active
US9165843B2	Systems and methods of automatically detecting failure patterns for semiconductor wafer fabrication processes	Electricity	1	Active
US10083860B2	Semiconductor structure with resist protective oxide on isolation structure and method of manufacturing the same	Electricity	0	Active
US9633860B2	Semiconductor structure with resist protective oxide on isolation structure and method of manufacturing the same	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.