Inventor · Hachioji, JP

Jun Etoh

59Patents
22h-index
64Co-inventors
91Inventor score

Filing activity: Jan 27, 1975 → Oct 24, 2022

Most-cited inventions

PatentTitleAreaCited byStatus
US5539279A Ferroelectric memory Physics 179 Expired
US4021835A Semiconductor device and a method for fabricating the same Electricity 143 Expired
US4086642A Protective circuit and device for metal-oxide-semiconductor field effect transistor and method for fabricating the device Electricity 109 Expired
US5526313A Large scale integrated circuit with sense amplifier circuits for low voltage operation Physics 99 Expired
US5297097A Large scale integrated circuit for low voltage operation Physics 75 Expired
US4994688A Semiconductor device having a reference voltage generating circuit Emerging Cross-Sectional Technologies 68 Expired
US5426616A Semiconductor IC device having a voltage conversion circuit which generates an internal supply voltage having value compensated for external supply voltage variations Physics 65 Expired
US4811299A Dynamic RAM device having a separate test mode capability Physics 51 Expired
US5265055A Semiconductor memory having redundancy circuit Physics 44 Expired
US5262999A Large scale integrated circuit for low voltage operation Physics 41 Expired
US5384740A Reference voltage generator Physics 40 Expired
US4716313A Pulse drive circuit Electricity 40 Expired
US5617365A Semiconductor device having redundancy circuit Physics 37 Expired
US6909647B2 Semiconductor device having redundancy circuit Physics 36 Expired
US5579256A Semiconductor memory device and defect remedying method thereof Emerging Cross-Sectional Technologies 34 Expired
USRE37593E1 Large scale integrated circuit with sense amplifier circuits for low voltage operation General 34 Expired
US4796234A Semiconductor memory having selectively activated blocks including CMOS sense amplifiers Physics 34 Expired
US4503522A Dynamic type semiconductor monolithic memory Physics 28 Expired
US5602771A Semiconductor memory device and defect remedying method thereof Electricity 27 Expired
US5376839A Large scale integrated circuit having low internal operating voltage Electricity 27 Expired
US4992985A Method for selectively initiating/terminating a test mode in an address multiplexed DRAM and address multiplexed DRAM having such a capability Physics 26 Expired
US5262993A Semiconductor memory having redundancy circuit with means to switch power from a normal memory block to a spare memory block Physics 23 Expired
US5179539A Large scale integrated circuit having low internal operating voltage Electricity 22 Expired
US4635146A Reel brake and associated tension arm control device for a reversible tape recording and/or reproducing apparatus Physics 20 Expired
US6337817B1 Semiconductor device having redundancy circuit Physics 19 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.