Junichi Tashiro
31Patents
5h-index
54Co-inventors
68Inventor score
Filing activity: Nov 29, 2002 → Jun 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7827148B2 | Medical equipment having audit log managing function | Physics | 28 | Active |
| US9030544B2 | Wireless video transmission system and transmission device | Electricity | 7 | Active |
| US8957952B2 | Color signal transmission device, wireless image transmission system, and transmitter | Electricity | 6 | Active |
| US7423266B2 | Sample height regulating method, sample observing method, sample processing method and charged particle beam apparatus | Electricity | 5 | Active |
| US8198603B2 | Sample preparing device and sample posture shifting method | Electricity | 5 | Active |
| US7172839B2 | Photomask correction method using composite charged particle beam, and device used in the correction method | Physics | 4 | Expired |
| US8274063B2 | Composite focused ion beam device, process observation method using the same, and processing method | Electricity | 3 | Active |
| US8274049B2 | Sample processing and observing method | Electricity | 3 | Active |
| US8664598B2 | Electron microscope and specimen analyzing method | Electricity | 2 | Active |
| US8306264B2 | Section processing method and its apparatus | Electricity | 2 | Active |
| US7531796B2 | Focused ion beam apparatus and sample section forming and thin-piece sample preparing methods | Electricity | 2 | Active |
| US9396534B2 | Medical image processing apparatus and medical image processing system | Physics | 2 | Active |
| US8269194B2 | Composite focused ion beam device, and processing observation method and processing method using the same | Electricity | 1 | Active |
| US8657962B2 | Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus | Physics | 1 | Active |
| US7595488B2 | Method and apparatus for specifying working position on a sample and method of working the sample | Electricity | 1 | Active |
| US7755044B2 | Apparatus for working and observing samples and method of working and observing cross sections | Electricity | 1 | Active |
| US8542275B2 | Method and apparatus for cross-section processing and observation | Physics | 1 | Active |
| US10268802B2 | Medical image processing apparatus and medical image processing system | Physics | 1 | Active |
| US8426830B2 | Focused ion beam apparatus, sample processing method using the same, and computer program for focused ion beam processing | Electricity | 1 | Active |
| US10951800B2 | Endoscope system and endoscope processor | Electricity | 0 | Active |
| US9661081B2 | Wireless image transfer system and wireless image transfer method | Human Necessities | 0 | Active |
| US9584795B2 | Wireless transfer system | Electricity | 0 | Active |
| US10728470B2 | Image processing device, image processing method, and non-transitory computer readable medium storing image processing program | Electricity | 0 | Active |
| US7872231B2 | Sample relocation method in charged particle beam apparatus and charged particle beam apparatus as well as sample for transmission electron microscope | Electricity | 0 | Active |
| US8581206B2 | Focused ion beam system and sample processing method using the same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.