Ken Harada
34Patents
5h-index
54Co-inventors
72Inventor score
Filing activity: Jan 26, 1998 → Mar 24, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6863931B2 | Manufacturing method of product having sprayed coating film | Chemistry; Metallurgy | 16 | Expired |
| US8946628B2 | Electron beam interference device and electron beam interferometry | Electricity | 9 | Active |
| US6170257A | Variable thrust nozzle system | Mechanical Engineering; Lighting; Heating | 9 | Expired |
| US6838675B2 | Specimen observation system for applying external magnetic field | Electricity | 8 | Expired |
| US7538323B2 | Interferometer | Electricity | 7 | Expired |
| US7750298B2 | Interferometer having three electron biprisms | Electricity | 5 | Active |
| US7816648B2 | Electron interferometer or electron microscope | Electricity | 5 | Expired |
| US6077118A | Electrical connector having a metal shell | Electricity | 4 | Expired |
| US7923685B2 | Electron beam device | Electricity | 4 | Active |
| US7872755B2 | Interferometer | Electricity | 4 | Active |
| US8193494B2 | Transmission electron microscope and method for observing specimen image with the same | Electricity | 4 | Active |
| US7655905B2 | Charged particle beam equipment | Electricity | 3 | Active |
| US8785851B2 | Interference electron microscope | Electricity | 3 | Active |
| US7808814B2 | Magnetization state control device and magnetic information recording device | Electricity | 2 | Active |
| US9679738B2 | Electron microscope | Electricity | 2 | Active |
| US7939801B2 | Electron beam observation device using pre-specimen magnetic field as image-forming lens and specimen observation method | Electricity | 2 | Active |
| US10210962B2 | Charged particle beam device, optical device, irradiation method, diffraction grating system, and diffraction grating | Physics | 1 | Active |
| US8653472B2 | Electromagnetic field application system | Electricity | 1 | Active |
| US9365802B2 | Cleaning liquid for semiconductor device substrates and method of cleaning substrate for semiconductor devices | Chemistry; Metallurgy | 1 | Active |
| US7999652B2 | Thick film resistor | Electricity | 1 | Active |
| US10948426B2 | Particle beam device, observation method, and diffraction grating | Electricity | 0 | Active |
| US11677092B2 | Assembly method using assembly tool | Emerging Cross-Sectional Technologies | 0 | Active |
| US11066627B2 | Cleaning agent composition for semiconductor device substrate, method of cleaning semiconductor device substrate, method of manufacturing semiconductor device substrate, and semiconductor device substrate | Chemistry; Metallurgy | 0 | Active |
| US9864114B2 | Zone plate having annular or spiral shape and Y-shaped branching edge dislocation | Physics | 0 | Active |
| US11545712B2 | Shape correction device for frame body, and method for manufacturing electrolyte film/electrode structure provided with resin frame for fuel cell | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.