Koji Eguchi
15Patents
8h-index
32Co-inventors
68Inventor score
Filing activity: Nov 12, 1987 → Mar 11, 2004
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6194907A | Prober and electric evaluation method of semiconductor device | Physics | 68 | Expired |
| US4859622A | Method of making a trench capacitor for dram | Electricity | 24 | Expired |
| US5373192A | Electromigration resistance metal interconnect | Emerging Cross-Sectional Technologies | 17 | Expired |
| US6748704B2 | Factory layout | Emerging Cross-Sectional Technologies | 16 | Expired |
| US5471084A | Magnetoresistive element and manufacturing method therefor | Electricity | 14 | Expired |
| US5466638A | Method of manufacturing a metal interconnect with high resistance to electromigration | Emerging Cross-Sectional Technologies | 14 | Expired |
| US5200807A | Wiring connection structure for a semiconductor integrated circuit device | Electricity | 11 | Expired |
| US5381029A | Semiconductor device including semiconductor layer having impurity region and method of manufacturing the same | Electricity | 10 | Expired |
| US4849854A | Semiconductor device and method of manufacturing the same | Electricity | 8 | Expired |
| US7016749B2 | System and method for product designing, and recording medium | Physics | 7 | Expired |
| US5444186A | Multilayer conductive wire for semiconductor device and manufacturing method thereof | Electricity | 7 | Expired |
| US7298020B2 | Semiconductor device and method of manufacturing the same | Electricity | 3 | Expired |
| US5446301A | Semiconductor device including semiconductor layer having impurity region and method of manufacturing the same | Electricity | 3 | Expired |
| US6595428B2 | Process control device and process control method using a medium with rewritable marking technique | Emerging Cross-Sectional Technologies | 2 | Expired |
| US6705450B2 | Clean room having an escalator, and method of transporting a semiconductor device therein | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.