Mark Geshel
8Patents
3h-index
15Co-inventors
54Inventor score
Filing activity: Jun 10, 2002 → Aug 9, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7155052B2 | Method for pattern inspection | Physics | 16 | Expired |
| US11462300B2 | Methods and systems for sequence calling | Physics | 7 | Active |
| US8640060B2 | Method of generating a recipe for a manufacturing tool and system thereof | Physics | 5 | Active |
| US10161882B1 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Electricity | 3 | Active |
| US10290087B2 | Method of generating an examination recipe and system thereof | Physics | 1 | Active |
| US9141730B2 | Method of generating a recipe for a manufacturing tool and system thereof | Emerging Cross-Sectional Technologies | 1 | Active |
| US9401013B2 | Method of design-based defect classification and system thereof | Electricity | 0 | Active |
| US10663407B2 | Method of examining locations in a wafer with adjustable navigation accuracy and system thereof | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.