Inventor · Ganei Tikva, IL

Mark Shlick

29Patents
9h-index
40Co-inventors
71Inventor score

Filing activity: Apr 7, 2006 → Jul 28, 2023

Most-cited inventions

PatentTitleAreaCited byStatus
US7502254B2 Method for generating soft bits in flash memories Physics 55 Active
US7613045B2 Operation sequence and commands for measuring threshold voltage distribution in memory Physics 45 Active
US7865658B2 Method and system for balancing host write operations and cache flushing Physics 44 Active
US7876621B2 Adaptive dynamic reading of flash memories Physics 33 Active
US8073648B2 Measuring threshold voltage distribution in memory using an aggregate characteristic Physics 16 Active
US8059456B2 Programming a NAND flash memory with reduced program disturb Physics 12 Active
US11373710B1 Time division peak power management for non-volatile storage Physics 9 Active
US8125833B2 Adaptive dynamic reading of flash memories Physics 9 Active
US9996281B2 Temperature variation compensation Physics 9 Active
US8891301B1 Power drop protection for a data storage device Physics 8 Active
US11385802B2 Temperature variation compensation Physics 7 Active
US9484114B1 Decoding data using bit line defect information Physics 6 Active
US9711227B1 Non-volatile memory with in field failure prediction using leakage detection Physics 5 Active
US9218851B2 Power drop protection for a data storage device Physics 4 Active
US10481816B2 Dynamically assigning data latches Physics 3 Active
US8112682B2 Method and device for bad-block testing Physics 3 Active
US10642510B2 Temperature variation compensation Physics 3 Active
US7952928B2 Increasing read throughput in non-volatile memory Physics 3 Active
US7657699B2 Device and method for monitoring operation of a flash memory Physics 3 Active
US8059463B2 Method for generating soft bits in flash memories Physics 2 Active
US8443260B2 Error correction in copy back memory operations Physics 1 Active
US11449236B2 Data storage device with syndrome weight minimization for data alignment Electricity 1 Active
US10162538B2 Memory operation threshold adjustment based on bit line integrity data Physics 1 Active
US9400747B2 Batch command techniques for a data storage device Physics 1 Active
US10360045B2 Event-driven schemes for determining suspend/resume periods Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.