Michael Abraham
10Patents
6h-index
9Co-inventors
51Inventor score
Filing activity: Jun 26, 1998 → Aug 11, 2003
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6275291A | Micropolarimeter and ellipsometer | Physics | 22 | Expired |
| US6091499A | Method and device for automatic relative adjustment of samples in relation to an ellipsometer | Physics | 22 | Expired |
| US6420864B1 | Modular substrate measurement system | Electricity | 15 | Expired |
| US6045064A | Under-vehicle spray device | Performing Operations; Transporting | 9 | Expired |
| US6798513B2 | Measuring module | Physics | 7 | Expired |
| US6954267B2 | Device for measuring surface defects | Physics | 7 | Expired |
| US6935201B2 | Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locations | Electricity | 4 | Expired |
| US7030401B2 | Modular substrate measurement system | Emerging Cross-Sectional Technologies | 0 | Expired |
| US6734969B2 | Vacuum measurement device | Physics | 0 | Expired |
| US6891609B2 | Measurement box with module for measuring wafer characteristics | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.