Inventor · Phoenix, AZ, US

Michael S. Ameen

13Patents
11h-index
16Co-inventors
69Inventor score

Filing activity: Jul 16, 1993 → Mar 19, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US6161500A Apparatus and method for preventing the premature mixture of reactant gases in CVD and PECVD reactions Chemistry; Metallurgy 739 Expired
US6368987B1 Apparatus and method for preventing the premature mixture of reactant gases in CVD and PECVD reactions Chemistry; Metallurgy 571 Expired
US6274496A Method for single chamber processing of PECVD-Ti and CVD-TiN films for integrated contact/barrier applications in IC manufacturing Electricity 354 Expired
US5926737A Use of TiCl.sub.4 etchback process during integrated CVD-Ti/TiN wafer processing Electricity 201 Expired
US5834371A Method and apparatus for preparing and metallizing high aspect ratio silicon semiconductor device contacts to reduce the resistivity thereof Emerging Cross-Sectional Technologies 82 Expired
US5455197A Control of the crystal orientation dependent properties of a film deposited on a semiconductor wafer Electricity 40 Expired
US6143128A Apparatus for preparing and metallizing high aspect ratio silicon semiconductor device contacts to reduce the resistivity thereof Emerging Cross-Sectional Technologies 29 Expired
US6093645A Elimination of titanium nitride film deposition in tungsten plug technology using PE-CVD-TI and in-situ plasma nitridation Electricity 29 Expired
US6037252A Method of titanium nitride contact plug formation Electricity 19 Expired
US5972790A Method for forming salicides Electricity 19 Expired
US5989652A Method of low temperature plasma enhanced chemical vapor deposition of tin film over titanium for use in via level applications Electricity 17 Expired
US6635569B1 Method of passivating and stabilizing a Ti-PECVD process chamber and combined Ti-PECVD/TiN-CVD processing method and apparatus Chemistry; Metallurgy 9 Expired
US11170967B2 Liquid metal ion source Electricity 6 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.