Noam Dotan
26Patents
11h-index
21Co-inventors
75Inventor score
Filing activity: Jul 24, 1991 → Jan 11, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6407373B1 | Apparatus and method for reviewing defects on an object | Emerging Cross-Sectional Technologies | 106 | Expired |
| US5659172A | Reliable defect detection using multiple perspective scanning electron microscope images | Electricity | 92 | Expired |
| US6353222B1 | Determining defect depth and contour information in wafer structures using multiple SEM images | Electricity | 75 | Expired |
| US5216479A | Optical inspection system for distinguishing between first and second components in a laminate | Physics | 42 | Expired |
| US6521891B1 | Focusing method and system | Electricity | 35 | Expired |
| US6201240A | SEM image enhancement using narrow band detection and color assignment | Electricity | 33 | Expired |
| US6407386B1 | System and method for automatic analysis of defect material on semiconductors | Electricity | 27 | Expired |
| US6892013B2 | Fiber optical illumination system | Physics | 16 | Expired |
| US7180586B2 | System for detection of wafer defects | Physics | 15 | Expired |
| US6627886B1 | Secondary electron spectroscopy method and system | Emerging Cross-Sectional Technologies | 14 | Expired |
| US7633041B2 | Apparatus for determining optimum position of focus of an imaging system | Physics | 11 | Active |
| US6215895A | Apparatus and method for display panel inspection | Physics | 10 | Expired |
| US5771068A | Apparatus and method for display panel inspection | Physics | 10 | Expired |
| US6194718A | Method for reducing aliasing effects in scanning beam microscopy | Electricity | 9 | Expired |
| US7274444B2 | Multi mode inspection method and apparatus | Physics | 9 | Expired |
| US7525659B2 | System for detection of water defects | Physics | 8 | Expired |
| US7961763B2 | System for detection of wafer defects | Physics | 8 | Active |
| US7813541B2 | Method and apparatus for detecting defects in wafers | Physics | 5 | Active |
| US7260298B2 | Fiber optical illumination system | Physics | 4 | Expired |
| US7843559B2 | System for detection of wafer defects | Physics | 4 | Active |
| US7477383B2 | System for detection of wafer defects | Physics | 3 | Active |
| US10753355B2 | Borehole pump and method of using the same | Emerging Cross-Sectional Technologies | 1 | Active |
| US7480039B2 | Multi mode inspection method and apparatus | Physics | 0 | Active |
| US11692537B2 | Method and system for damping flow pulsation | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US11289973B2 | Borehole pump and method of using the same | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.