Norio Okabe
14Patents
9h-index
32Co-inventors
68Inventor score
Filing activity: Jul 18, 1996 → Apr 27, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| USD567125S1 | Stress meter | General | 62 | Expired |
| US6031292A | Semiconductor device, interposer for semiconductor device | Electricity | 42 | Expired |
| US6114753A | Circuit tape having adhesive film, semiconductor device, and a method for manufacturing the same | Emerging Cross-Sectional Technologies | 27 | Expired |
| US5866948A | Interposer for semiconductor device | Electricity | 23 | Expired |
| US6281570A | Tape carrier for BGA and semiconductor device using the same | Electricity | 18 | Expired |
| US6323058A | Semiconductor device, tab tape for semiconductor device, method of manufacturing the tab tape and method of manufacturing the semiconductor device | Electricity | 15 | Expired |
| US5837154A | Method of manufacturing double-sided circuit tape carrier | Electricity | 14 | Expired |
| US6433440B1 | Semiconductor device having a porous buffer layer for semiconductor device | Electricity | 12 | Expired |
| US6791194B1 | Circuit tape having adhesive film, semiconductor device, and a method for manufacturing the same | Electricity | 10 | Expired |
| US6376916B1 | Tape carrier for BGA and semiconductor device using the same | Electricity | 9 | Expired |
| US6353259B1 | Process for producing BGA type semiconductor device, TAB tape for BGA type semiconductor device, and BGA type semiconductor device | Electricity | 5 | Expired |
| US6506627B1 | Semiconductor device, tab tape for semiconductor device, method of manufacturing the tab tape and method of manufacturing the semiconductor device | Electricity | 4 | Expired |
| US7202570B2 | Circuit tape having adhesive film semiconductor device and a method for manufacturing the same | Emerging Cross-Sectional Technologies | 2 | Expired |
| US7038325B2 | Wiring tape for semiconductor device including a buffer layer having interconnected foams | Electricity | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.