Prasad Bhosale
16Patents
2h-index
38Co-inventors
46Inventor score
Filing activity: Mar 10, 2017 → Dec 6, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10096769B2 | Bottom electrode for MRAM applications | Electricity | 6 | Active |
| US10303829B2 | Automated method for integrated analysis of back end of the line yield, line resistance/capacitance and process performance | Electricity | 2 | Active |
| US10461248B2 | Bottom electrode for MRAM applications | Electricity | 2 | Active |
| US11476418B2 | Phase change memory cell with a projection liner | Emerging Cross-Sectional Technologies | 1 | Active |
| US11223655B2 | Semiconductor tool matching and manufacturing management in a blockchain | Electricity | 1 | Active |
| US10978388B2 | Skip via for metal interconnects | Electricity | 1 | Active |
| US12387937B2 | Sam formulations and cleaning to promote quick depositions | Electricity | 0 | Active |
| US10978342B2 | Interconnect with self-forming wrap-all-around barrier layer | Electricity | 0 | Active |
| US10242872B2 | Rework of patterned dielectric and metal hardmask films | Electricity | 0 | Active |
| US11074387B2 | Automated method for integrated analysis of back end of the line yield, line resistance/capacitance and process performance | Electricity | 0 | Active |
| US10658235B2 | Rework for metal interconnects using etch and thermal anneal | Electricity | 0 | Active |
| US10585998B2 | Automated method for integrated analysis of back end of the line yield, line resistance/capacitance and process performance | Electricity | 0 | Active |
| US11444029B2 | Back-end-of-line interconnect structures with varying aspect ratios | Electricity | 0 | Active |
| US12336294B2 | Gate-cut and separation techniques for enabling independent gate control of stacked transistors | Electricity | 0 | Active |
| US11800817B2 | Phase change memory cell galvanic corrosion prevention | Electricity | 0 | Active |
| US11901224B2 | Rework for metal interconnects using etch and thermal anneal | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.