Ron Naftali
45Patents
10h-index
61Co-inventors
78Inventor score
Filing activity: Dec 24, 1998 → Oct 6, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7468506B2 | Spot grid array scanning system | Physics | 53 | Expired |
| US6124924A | Focus error correction method and apparatus | Physics | 50 | Expired |
| US7468507B2 | Optical spot grid array scanning system | Physics | 29 | Expired |
| US6657714B2 | Defect detection with enhanced dynamic range | Physics | 22 | Expired |
| US7630069B2 | Illumination system for optical inspection | Electricity | 18 | Active |
| US6366352B1 | Optical inspection method and apparatus utilizing a variable angle design | Physics | 18 | Expired |
| US6882417B2 | Method and system for detecting defects | Electricity | 13 | Expired |
| US6809808B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 13 | Expired |
| US6861660B2 | Process and assembly for non-destructive surface inspection | Physics | 10 | Expired |
| US7030978B2 | System and method for inspection of a substrate that has a refractive index | Physics | 10 | Expired |
| US7053395B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 8 | Expired |
| US7109463B2 | Amplifier circuit with a switching device to provide a wide dynamic output range | Electricity | 8 | Expired |
| US6853475B2 | Wafer defect detection system with traveling lens multi-beam scanner | Physics | 6 | Expired |
| US7053999B2 | Method and system for detecting defects | Physics | 6 | Expired |
| US6898304B2 | Hardware configuration for parallel data processing without cross communication | Physics | 5 | Expired |
| US6914670B1 | Defect detection with enhanced dynamic range | Physics | 5 | Expired |
| US6469784B2 | Optical inspection method and apparatus utilizing a variable angle design | Physics | 5 | Expired |
| US7173694B2 | Method and system for detecting defects | Physics | 5 | Expired |
| US7184612B2 | Hardware configuration for parallel data processing without cross communication | Physics | 4 | Expired |
| US7428850B2 | Integrated in situ scanning electronic microscope review station in semiconductor wafers and photomasks optical inspection system | Electricity | 4 | Active |
| US7924419B2 | Illumination system for optical inspection | Electricity | 3 | Active |
| US7460221B2 | Method and system for detecting defects | Physics | 3 | Active |
| US10504687B2 | Signal separator for a multi-beam charged particle inspection apparatus | Electricity | 3 | Active |
| US10811219B2 | Method for evaluating a region of an object | Electricity | 3 | Active |
| US7973919B2 | High resolution wafer inspection system | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.