Sandip Halder
10Patents
1h-index
21Co-inventors
50Inventor score
Filing activity: May 23, 2008 → Jul 2, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10732124B2 | Methods for detecting defects of a lithographic pattern | Physics | 2 | Active |
| US8460946B2 | Methods of processing and inspecting semiconductor substrates | Physics | 1 | Active |
| US10061209B2 | Method for verifying a pattern of features printed by a lithography process | Physics | 1 | Active |
| US9874821B2 | Method for hotspot detection and ranking of a lithographic mask | Physics | 0 | Active |
| US8735182B2 | Method for detecting embedded voids in a semiconductor substrate | Electricity | 0 | Active |
| US12066763B2 | Sensitivity improvement of optical and SEM defection inspection | Electricity | 0 | Active |
| US9983154B2 | Method for inspecting a pattern of features on a semiconductor die | Physics | 0 | Active |
| US10818504B2 | Method for producing a pattern of features by lithography and etching | Physics | 0 | Active |
| US12243193B2 | Method for de-noising an electron microscope image | Physics | 0 | Active |
| US8513163B2 | Substrate for a superconducting thin-film strip conductor | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.