Sanjeev Tandon
8Patents
5h-index
18Co-inventors
56Inventor score
Filing activity: Jul 6, 2004 → May 5, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7294581B2 | Method for fabricating silicon nitride spacer structures | Electricity | 510 | Expired |
| US7473655B2 | Method for silicon based dielectric chemical vapor deposition | Electricity | 409 | Expired |
| US7465669B2 | Method of fabricating a silicon nitride stack | Electricity | 28 | Active |
| US7488690B2 | Silicon nitride film with stress control | Electricity | 9 | Expired |
| US7416995B2 | Method for fabricating controlled stress silicon nitride films | Electricity | 9 | Active |
| US7365029B2 | Method for silicon nitride chemical vapor deposition | Electricity | 4 | Active |
| US9929215B2 | Method of optimizing an interface for processing of an organic semiconductor | Electricity | 1 | Active |
| US12342646B2 | Architecture for and method of operating a metal oxide based sensor | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.