Souk Kim
12Patents
1h-index
36Co-inventors
50Inventor score
Filing activity: Mar 14, 2013 → Aug 2, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11004712B2 | Method of inspecting semiconductor wafer, inspection system for performing the same, and method of fabricating semiconductor device using the same | Physics | 1 | Active |
| US12092656B2 | Test apparatus and test method thereof | Physics | 0 | Active |
| US9148549B2 | Image processing method and image processing apparatus using time axis low band pass filter | Physics | 0 | Active |
| US11181831B2 | Methods of manufacturing semiconductor device | Electricity | 0 | Active |
| US10410937B2 | Optical measuring method for semiconductor wafer including a plurality of patterns and method of manufacturing semiconductor device using optical measurement | Electricity | 0 | Active |
| US9583402B2 | Method of manufacturing a semiconductor device using semiconductor measurement system | Electricity | 0 | Active |
| US12110938B2 | Vibration isolation table for semiconductor equipment and vibration isolation table system including the same | Mechanical Engineering; Lighting; Heating | 0 | Active |
| US10373796B2 | Method of inspecting wafer using electron beam | Electricity | 0 | Active |
| US9417055B2 | Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film | Physics | 0 | Active |
| US12385946B2 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Electricity | 0 | Active |
| US12362138B2 | Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same | Electricity | 0 | Active |
| US11017525B2 | Semiconductor pattern detecting apparatus | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.