Inventor · Irvine, CA, US

Steve Choi

21Patents
5h-index
27Co-inventors
69Inventor score

Filing activity: Mar 23, 1998 → Dec 17, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US5982683A Enhanced method of testing semiconductor devices having nonvolatile elements Physics 20 Expired
US9715913B1 Temperature code circuit with single ramp for calibration and determination Electricity 18 Active
US9154027B2 Dynamic load matching charge pump for reduced current consumption Electricity 17 Active
US9653126B2 Digital ramp rate control for charge pumps Physics 10 Active
US7567458B2 Flash memory array having control/decode circuitry for disabling top gates of defective memory cells Physics 5 Expired
US7447073B2 Method for handling a defective top gate of a source-side injection flash memory array Physics 5 Active
US9368224B2 Self-adjusting regulation current for memory array source line Physics 4 Active
US7663921B2 Flash memory array with a top gate line dynamically coupled to a word line Physics 3 Active
US7626863B2 Flash memory array system including a top gate memory cell Physics 2 Active
US8270213B2 Flash memory array system including a top gate memory cell Physics 2 Active
US7778080B2 Flash memory array system including a top gate memory cell Physics 1 Active
US7848140B2 Flash memory array system including a top gate memory cell Physics 1 Active
US7848167B2 Apparatus and method for generating wide-range regulated supply voltages for a flash memory Physics 1 Active
US9514831B2 Multi-clock generation through phase locked loop (PLL) reference Electricity 1 Active
US11253266B2 Sleeve for delivery of embolic coil Human Necessities 0 Active
US6381918B2 Wallboard adhesive Chemistry; Metallurgy 0 Expired
US10415560B2 Dual-head, pulseless peristaltic-type metering pump Mechanical Engineering; Lighting; Heating 0 Active
US10910072B1 Accurate self-calibrated negative to positive voltage conversion circuit and method Electricity 0 Active
US6972994B2 Circuit and a method to screen for defects in an addressable line in a non-volatile memory Physics 0 Expired
US8581595B2 Method of measuring flash memory cell current Physics 0 Active
US6300400A Wallboard adhesive Chemistry; Metallurgy 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.