Tatsuya Fukumura
14Patents
3h-index
24Co-inventors
56Inventor score
Filing activity: Apr 8, 2003 → Jul 12, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7015090B2 | Method of manufacturing a semiconductor device having trenches for isolation and capacitor formation trenches | Electricity | 19 | Expired |
| US7462905B2 | Nonvolatile semiconductor memory device, semiconductor device and method of manufacturing nonvolatile semiconductor memory device | Electricity | 7 | Active |
| US7064380B2 | Semiconductor device and a method of manufacturing the same | Physics | 5 | Expired |
| US7312123B2 | Semiconductor device and a method of manufacturing the same | Physics | 3 | Expired |
| US8466507B2 | Semiconductor device and a method of manufacturing the same | Physics | 2 | Active |
| US8546151B2 | Method for manufacturing magnetic storage device and magnetic storage device | Electricity | 2 | Active |
| US9391178B2 | Method of manufacturing semiconductor device | Electricity | 2 | Active |
| US8212305B2 | Semiconductor device with improved insulating film and floating gate arrangement to decrease memory cell size without reduction of capacitance | Physics | 2 | Active |
| US7906346B2 | Method for manufacturing a magnetic memory device and magnetic memory device | Electricity | 2 | Active |
| US9666239B2 | Semiconductor device | Electricity | 2 | Active |
| US9412747B2 | Semiconductor device and a method of manufacturing the same | Physics | 0 | Active |
| US7662686B2 | Semiconductor device and a method of manufacturing the same | Physics | 0 | Active |
| US10147738B2 | Semiconductor device and method for manufacturing semiconductor device | Electricity | 0 | Active |
| US8907399B2 | Semiconductor device with flash memory cells having improved arrangement for floating gate electrodes and control gate electrodes of the flash memory cells | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.