Toshie Yaguchi
20Patents
6h-index
35Co-inventors
69Inventor score
Filing activity: Jul 24, 1997 → Aug 27, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6495838B1 | Sample heating holder, method of observing a sample and charged particle beam apparatus | Electricity | 32 | Expired |
| US7612337B2 | Focused ion beam system and a method of sample preparation and observation | Electricity | 17 | Active |
| US5898177A | Electron microscope | Electricity | 11 | Expired |
| US8878144B2 | Electron microscope and sample holder | Electricity | 6 | Active |
| US7863564B2 | Electric charged particle beam microscope and microscopy | Electricity | 6 | Active |
| US8835847B2 | Sample holding apparatus for electron microscope, and electron microscope apparatus | Electricity | 6 | Active |
| US8604429B2 | Electron beam device and sample holding device for electron beam device | Electricity | 5 | Active |
| US6992286B2 | Material characterization system | Electricity | 5 | Expired |
| US7622714B2 | Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus | Electricity | 4 | Active |
| US10068745B2 | Charged particle beam device and sample holder for charged particle beam device | Electricity | 2 | Active |
| US8588499B2 | Image processing method, image processing system, and X-ray computed tomography system | Electricity | 1 | Active |
| US9099281B2 | Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus | Electricity | 1 | Active |
| US10636621B2 | Charged particle beam device for moving an aperture having plurality of openings and sample observation method | Electricity | 1 | Active |
| US12183542B2 | Transmission electron microscope and imaging method | Electricity | 0 | Active |
| US9378922B2 | Electron microscope and electron microscope sample retaining device | Electricity | 0 | Active |
| US11133150B2 | Specimen holder and charged particle beam device provided with same | General | 0 | Revoked |
| US9754762B2 | Electron microscope and sample observation method | Electricity | 0 | Active |
| US11177109B2 | Specimen holder and charged particle beam device provided with same | Electricity | 0 | Active |
| US10535497B2 | Electron microscope and imaging method | Electricity | 0 | Active |
| US12170184B2 | Transmission electron microscope and inspection method using transmission electron microscope | Emerging Cross-Sectional Technologies | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.