Wallace E. Fister
17Patents
7h-index
13Co-inventors
59Inventor score
Filing activity: Jul 1, 1997 → Mar 19, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5935263A | Method and apparatus for memory array compressed data testing | Physics | 472 | Expired |
| US6452868B1 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | Physics | 75 | Expired |
| US6324657A | On-clip testing circuit and method for improving testing of integrated circuits | Physics | 32 | Expired |
| US6049505A | Method and apparatus for generating memory addresses for testing memory devices | Physics | 12 | Expired |
| US6327199A | Method for testing memory devices | Physics | 8 | Expired |
| US8687435B2 | System and method for reducing pin-count of memory devices, and memory device testers for same | Physics | 8 | Active |
| US6839292B2 | Apparatus and method for parallel programming of antifuses | Physics | 8 | Expired |
| US7554858B2 | System and method for reducing pin-count of memory devices, and memory device testers for same | Physics | 5 | Active |
| US6115303A | Method and apparatus for testing memory devices | Physics | 4 | Expired |
| US8072820B2 | System and method for reducing pin-count of memory devices, and memory device testers for same | Physics | 4 | Active |
| US8400844B2 | System and method for reducing pin-count of memory devices, and memory device testers for same | Physics | 3 | Active |
| US6538938B2 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | Physics | 3 | Expired |
| US6483773B1 | Method for generating memory addresses for testing memory devices | Physics | 2 | Expired |
| US6285609A | Method and apparatus for testing memory devices | Physics | 1 | Expired |
| US6510102B2 | Method for generating memory addresses for accessing memory-cell arrays in memory devices | Physics | 1 | Expired |
| US6104669A | Method and apparatus for generating memory addresses for testing memory devices | Physics | 0 | Expired |
| US6252811A | Method and apparatus for testing memory devices | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.