Inventor · Boise, ID, US

William Tandy

14Patents
5h-index
17Co-inventors
59Inventor score

Filing activity: Aug 25, 2000 → Dec 28, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US6524881B1 Method and apparatus for marking a bare semiconductor die Emerging Cross-Sectional Technologies 36 Expired
US6692978B2 Methods for marking a bare semiconductor die Emerging Cross-Sectional Technologies 25 Expired
US6734032B2 Method and apparatus for marking a bare semiconductor die Emerging Cross-Sectional Technologies 25 Expired
US7094618B2 Methods for marking a packaged semiconductor die including applying tape and subsequently marking the tape Emerging Cross-Sectional Technologies 15 Expired
US7238543B2 Methods for marking a bare semiconductor die including applying a tape having energy-markable properties Emerging Cross-Sectional Technologies 10 Expired
US6969918B1 System for fabricating semiconductor components using mold cavities having runners configured to minimize venting Emerging Cross-Sectional Technologies 5 Expired
US9709793B1 Deployable structure Physics 4 Active
US7095097B2 Integrated circuit device having reduced bow and method for making same Electricity 3 Expired
US7265453B2 Semiconductor component having dummy segments with trapped corner air Emerging Cross-Sectional Technologies 2 Expired
US7186589B2 Method for fabricating semiconductor components using mold cavities having runners configured to minimize venting Emerging Cross-Sectional Technologies 2 Expired
US6887740B2 Method for making an integrated circuit package having reduced bow Electricity 2 Expired
US6577018B1 Integrated circuit device having reduced bow and method for making same Electricity 1 Expired
US10921245B2 Method and systems for remote emission detection and rate determination Emerging Cross-Sectional Technologies 1 Active
US7344921B2 Integrated circuit device having reduced bow and method for making same Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.