Yousuke Itagaki
14Patents
8h-index
6Co-inventors
57Inventor score
Filing activity: Nov 1, 2000 → Jun 28, 2007
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8051799B2 | Object-processing apparatus controlling production of particles in electric field or magnetic field | Electricity | 358 | Active |
| US6768324B1 | Semiconductor device tester which measures information related to a structure of a sample in a depth direction | Electricity | 97 | Expired |
| US6559662B1 | Semiconductor device tester and semiconductor device test method | Physics | 25 | Expired |
| US6614244B2 | Semiconductor device inspecting apparatus | Physics | 18 | Expired |
| US7385195B2 | Semiconductor device tester | Electricity | 13 | Expired |
| US6946857B2 | Semiconductor device tester | Electricity | 12 | Expired |
| US6975125B2 | Semiconductor device tester | Electricity | 9 | Expired |
| US7321805B2 | Production managing system of semiconductor device | Electricity | 8 | Expired |
| US6850079B2 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Electricity | 7 | Expired |
| US7974067B2 | Plasma processing apparatus and method of suppressing abnormal discharge therein | Electricity | 4 | Active |
| US6711453B2 | Production managing system of semiconductor device | Electricity | 4 | Expired |
| US6842663B2 | Production managing system of semiconductor device | Electricity | 2 | Expired |
| US7002361B2 | Film thickness measuring apparatus and a method for measuring a thickness of a film | Electricity | 2 | Expired |
| US6837936B2 | Semiconductor manufacturing device | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.