Yu-Ching Lee
44Patents
2h-index
61Co-inventors
56Inventor score
Filing activity: Apr 17, 2006 → Aug 7, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11256183B2 | Detection method and system for pellicle membrane of photomask | Physics | 2 | Active |
| US9933699B2 | Pellicle aging estimation and particle removal from pellicle via acoustic waves | Physics | 2 | Active |
| US11022889B2 | Overlay-shift measurement system and method for manufacturing semiconductor structure and measuring alignment mark of semiconductor structure | Electricity | 2 | Active |
| US10534219B2 | Array of point light sources contained within segmented reflective partitions | Physics | 1 | Active |
| US10962888B2 | Structures for acoustic wave overlay error determination using periodic structures | Physics | 1 | Active |
| US10877371B1 | Global dynamic detection method and system for protective film of photomask | Physics | 1 | Active |
| US9838257B2 | Network apparatus for temporarily accessing network setting and method using thereof | Electricity | 1 | Active |
| US8449881B2 | Anti-α-enolase I antibodies for diagnosis and treatment of α-enolase I-associated diseases | Chemistry; Metallurgy | 1 | Active |
| US10126644B2 | Pellicle for advanced lithography | Physics | 1 | Active |
| US10503082B2 | Optical reticle load port | Physics | 1 | Active |
| US7545038B2 | Bumping process and bump structure | Electricity | 1 | Active |
| US10658215B2 | Reticle transportation container | Electricity | 1 | Active |
| US10915017B2 | Multi-function overlay marks for reducing noise and extracting focus and critical dimension information | Electricity | 1 | Active |
| US10777510B2 | Semiconductor device including dummy via anchored to dummy metal layer | Electricity | 1 | Active |
| US10998213B2 | Reticle transportation container | Electricity | 0 | Active |
| US12189304B2 | Method and structures for acoustic wave overlay error determination | Physics | 0 | Active |
| US11448975B2 | Multi-function overlay marks for reducing noise and extracting focus and critical dimension information | Electricity | 0 | Active |
| US8401296B2 | Image processing method for locating and recognizing barcodes in image frame, computer readable storage medium, and image processing apparatus | Physics | 0 | Active |
| US11018037B2 | Optical reticle load port | Electricity | 0 | Active |
| US12248131B2 | Portable confocal optical scanning microscopic device | Physics | 0 | Active |
| US11578121B2 | Anti-EGF like domain multiple 6 (EGFL6) antibodies | Chemistry; Metallurgy | 0 | Active |
| US9951121B2 | Phage displaying system expressing single chain antibody | Chemistry; Metallurgy | 0 | Active |
| US9734271B2 | Method of determining galvanic corrosion and interconnect structure in a semiconductor device for prevention of galvanic corrosion | Electricity | 0 | Active |
| US10766951B2 | Antibodies against infectious diseases | Physics | 0 | Active |
| US12055860B2 | Multi-function overlay marks for reducing noise and extracting focus and critical dimension information | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.