Inventor · Niigata, JP

Yuichi Miyoshi

18Patents
4h-index
25Co-inventors
60Inventor score

Filing activity: Jul 27, 1989 → Jul 17, 2019

Most-cited inventions

PatentTitleAreaCited byStatus
US5075051A Molding process and apparatus for transferring plural molds to plural stations Performing Operations; Transporting 37 Expired
US6291350A Method of polishing semiconductor wafer Performing Operations; Transporting 9 Expired
US7620192B2 Electret covered with an insulated film and an electret condenser having the electret Electricity 9 Expired
US7853027B2 Electret condenser Performing Operations; Transporting 9 Expired
US6214126A Method for cleaning a silicon substrate Emerging Cross-Sectional Technologies 4 Expired
US9360666B2 Plastics optical component and method for manufacturing the same Emerging Cross-Sectional Technologies 3 Active
US6251000A Substrate holder, method for polishing substrate, and method for fabricating semiconductor device Performing Operations; Transporting 2 Expired
US8166827B2 MEMS device and method for manufacturing the same Performing Operations; Transporting 2 Active
US8067811B2 MEMS device, MEMS device module and acoustic transducer Electricity 2 Active
US8146437B2 Diaphragm structure and MEMS device Electricity 1 Active
US9989674B2 Plastics optical component and method for manufacturing the same Emerging Cross-Sectional Technologies 1 Active
US7847359B2 MEMS device, MEMS device module and acoustic transducer Electricity 1 Active
US9409168B2 Microfluidic device Physics 0 Active
US6451707B2 Method of removing reaction product due to plasma ashing of a resist pattern Electricity 0 Expired
US11879833B2 Circular dichroism measurement device and circular dichroism measurement method Physics 0 Active
US11402320B2 Phase difference control device Physics 0 Active
US8320589B2 Electret condenser Performing Operations; Transporting 0 Active
US10191078B2 Acceleration sensor Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.