Patent · US Active

Apparatus and methods for reducing particles in semiconductor process chambers

US10770269B2 · kind B2 · utility

0Cited by
11References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 2017
Grant dateSep 8, 2020
Priority date
Expiry dateFeb 23, 2038

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/13
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

Embodiments of the present disclosure generally provide various apparatus and methods for reducing particles in a semiconductor processing chamber. One embodiment of present disclosure provides a vacuum screen assembly disposed over a vacuum port to prevent particles generated by the vacuum pump from entering substrate processing regions. Another embodiment of the present disclosure provides a perforated chamber liner around a processing region of the substrate. Another embodiment of the present disclosure provides a gas distributing chamber liner for distributing a cleaning gas around the substrate support under the substrate supporting surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.