Shahid Rauf
90Patents
12h-index
109Co-inventors
87Inventor score
Filing activity: Oct 6, 1989 → Feb 13, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9741546B2 | Symmetric plasma process chamber | Electricity | 365 | Active |
| US8512509B2 | Plasma reactor gas distribution plate with radially distributed path splitting manifold | Electricity | 211 | Active |
| US8404598B2 | Synchronized radio frequency pulsing for plasma etching | Electricity | 69 | Active |
| US8382999B2 | Pulsed plasma high aspect ratio dielectric process | Electricity | 51 | Active |
| US7968469B2 | Method of processing a workpiece in a plasma reactor with variable height ground return path to control plasma ion density uniformity | Electricity | 39 | Active |
| US8313664B2 | Efficient and accurate method for real-time prediction of the self-bias voltage of a wafer and feedback control of ESC voltage in plasma processing chamber | Electricity | 35 | Active |
| US10546728B2 | Symmetric plasma process chamber | Electricity | 35 | Active |
| US10453656B2 | Symmetric plasma process chamber | Electricity | 33 | Active |
| US10580620B2 | Symmetric plasma process chamber | Electricity | 33 | Active |
| US10535502B2 | Symmetric plasma process chamber | Electricity | 32 | Active |
| US8962488B2 | Synchronized radio frequency pulsing for plasma etching | Electricity | 23 | Active |
| US8075728B2 | Gas flow equalizer plate suitable for use in a substrate process chamber | Electricity | 20 | Active |
| US7544605B2 | Method of making a contact on a backside of a die | Electricity | 12 | Active |
| US7967996B2 | Process for wafer backside polymer removal and wafer front side photoresist removal | Electricity | 10 | Active |
| US7579282B2 | Method for removing metal foot during high-k dielectric/metal gate etching | Electricity | 9 | Active |
| US8206552B2 | RF power delivery system in a semiconductor apparatus | Electricity | 8 | Active |
| US7988815B2 | Plasma reactor with reduced electrical skew using electrical bypass elements | Electricity | 8 | Active |
| US7335602B2 | Charge-free layer by layer etching of dielectrics | Electricity | 7 | Expired |
| US7879731B2 | Improving plasma process uniformity across a wafer by apportioning power among plural VHF sources | Electricity | 7 | Active |
| US8329593B2 | Method and apparatus for removing polymer from the wafer backside and edge | Electricity | 7 | Active |
| US9161428B2 | Independent control of RF phases of separate coils of an inductively coupled plasma reactor | Electricity | 7 | Active |
| US8076247B2 | Plasma process uniformity across a wafer by controlling RF phase between opposing electrodes | Electricity | 7 | Active |
| US7552736B2 | Process for wafer backside polymer removal with a ring of plasma under the wafer | Electricity | 6 | Active |
| US9082590B2 | Symmetrical inductively coupled plasma source with side RF feeds and RF distribution plates | Electricity | 6 | Active |
| US10170279B2 | Multiple coil inductively coupled plasma source with offset frequencies and double-walled shielding | Electricity | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.