ACORN TECHNOLOGIES, INC.
78Patents
60Active
78Granted
53Portfolio score
Filing activity: Oct 25, 1994 → May 16, 2018 · 22 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5961582A | Distributed and portable execution environment | Physics | 162 | Expired |
| US6891234B1 | Transistor with workfunction-induced charge layer | Electricity | 157 | Expired |
| US7112478B2 | Insulated gate field effect transistor having passivated Schottky barriers to the channel | Emerging Cross-Sectional Technologies | 77 | Expired |
| US6198113A | Electrostatically operated tunneling transistor | Emerging Cross-Sectional Technologies | 56 | Expired |
| US7176483B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 54 | Expired |
| US7084423B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 49 | Expired |
| US7700416B1 | Tensile strained semiconductor on insulator using elastic edge relaxation and a sacrificial stressor layer | Emerging Cross-Sectional Technologies | 35 | Active |
| US6594103B1 | Read channel generating absolute value servo signal | Physics | 35 | Expired |
| US6545836B1 | Servo control apparatus and method using absolute value input signals | Physics | 30 | Expired |
| US7382021B2 | Insulated gate field-effect transistor having III-VI source/drain layer(s) | Electricity | 25 | Expired |
| US6833556B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 23 | Expired |
| US7884003B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 23 | Active |
| US7462860B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 21 | Expired |
| US8212336B2 | Field effect transistor source or drain with a multi-facet surface | Electricity | 21 | Active |
| US7338834B2 | Strained silicon with elastic edge relaxation | Electricity | 20 | Active |
| US9209261B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 20 | Active |
| US8731017B2 | Tensile strained semiconductor photon emission and detection devices and integrated photonics system | Electricity | 19 | Active |
| US7883980B2 | Insulated gate field effect transistor having passivated schottky barriers to the channel | Emerging Cross-Sectional Technologies | 18 | Active |
| US9425277B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 16 | Active |
| US8263467B2 | Process for fabricating a self-aligned deposited source/drain insulated gate field-effect transistor | Electricity | 16 | Active |
| US9461167B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
| US6381088B1 | Apparatus for developing a dynamic servo signal from data in a magnetic disc drive and method | Physics | 15 | Expired |
| US8658523B2 | Method for making semiconductor insulated-gate field-effect transistor having multilayer deposited metal source(s) and/or drain(s) | Electricity | 15 | Active |
| US9905691B2 | Method for depinning the fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
| US10090395B2 | Method for depinning the Fermi level of a semiconductor at an electrical junction and devices incorporating such junctions | Electricity | 15 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.