Eugenus, Inc.
16Patents
16Active
16Granted
54Portfolio score
Filing activity: Jun 2, 2017 → Oct 17, 2023
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11482413B2 | Conformal and smooth titanium nitride layers and methods of forming the same | Electricity | 4 | Active |
| US11361992B2 | Conformal titanium nitride-based thin films and methods of forming same | Electricity | 2 | Active |
| US11832537B2 | Titanium silicon nitride barrier layer | Electricity | 2 | Active |
| US11401607B2 | TiSiN coating method | Chemistry; Metallurgy | 1 | Active |
| US11942365B2 | Multi-region diffusion barrier containing titanium, silicon and nitrogen | Electricity | 1 | Active |
| US12165918B2 | Conformal titanium nitride-based thin films and methods of forming same | Electricity | 1 | Active |
| US11587784B2 | Smooth titanium nitride layers and methods of forming the same | Chemistry; Metallurgy | 1 | Active |
| US12408569B2 | Titanium silicon nitride barrier layer | Electricity | 0 | Active |
| US12272599B2 | Conformal and smooth titanium nitride layers and methods of forming the same | Electricity | 0 | Active |
| US12029144B2 | Encapsulation layer for chalcogenide material | Electricity | 0 | Active |
| US12325914B2 | Precursor delivery system and method for cyclic deposition | Electricity | 0 | Active |
| US11459654B2 | Liquid precursor injection for thin film deposition | Electricity | 0 | Active |
| US11328944B2 | Systems and methods of placing substrates in semiconductor manufacturing equipment | Electricity | 0 | Active |
| US12308226B2 | Conformal and smooth titanium nitride layers and methods of forming the same | Electricity | 0 | Active |
| US12283486B2 | Conformal and smooth titanium nitride layers and methods of forming the same | Electricity | 0 | Active |
| US12431388B2 | Conformal titanium silicon nitride-based thin films and methods of forming same | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.