FEI EFA, Inc.
18Patents
18Active
18Granted
50Portfolio score
Filing activity: Dec 10, 2012 → Dec 16, 2019
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9891280B2 | Probe-based data collection system with adaptive mode of probing controlled by local sample properties | Physics | 5 | Active |
| US10539589B2 | Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing | Electricity | 4 | Active |
| US9869696B2 | Method for imaging a feature using a scanning probe microscope | Physics | 1 | Active |
| US9905014B2 | Method and system for the examination of a sample by means of thermography | Physics | 1 | Active |
| US10545186B2 | Method and system for resolving hot spots in LIT | Emerging Cross-Sectional Technologies | 1 | Active |
| US10209274B2 | Laser-assisted device alteration using synchronized laser pulses | Physics | 1 | Active |
| US10133051B2 | Self correcting floating SIL tip | Physics | 0 | Active |
| US10041997B2 | System and method for fault isolation by emission spectra analysis | Physics | 0 | Active |
| US9816866B2 | Method for examination of a sample by means of the heat flow thermography | Physics | 0 | Active |
| US10620263B2 | System and method for fault isolation by emission spectra analysis | Physics | 0 | Active |
| US9817060B2 | Optimized wavelength photon emission microscope for VLSI devices | Physics | 0 | Active |
| US9915700B2 | System and method for modulation mapping | Physics | 0 | Active |
| US11022646B2 | Method and system for resolving hot spots in LIT | Emerging Cross-Sectional Technologies | 0 | Active |
| US11353479B2 | Laser-assisted device alteration using synchronized laser pulses | Physics | 0 | Active |
| US9903824B2 | Spectral mapping of photo emission | Physics | 0 | Active |
| US9885878B2 | Apparatus and method for annular optical power management | Physics | 0 | Active |
| US10126360B2 | Systems and method for laser voltage imaging | Physics | 0 | Active |
| US10718933B2 | Self correcting floating SIL tip | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.