Patent assignee · US · COMPANY

Pacific Western Systems

19Patents
0Active
19Granted
35Portfolio score

Filing activity: Feb 27, 1976 → Nov 6, 1998

Most-cited patents

PatentTitleAreaCited byStatus
US4500563A Independently variably controlled pulsed R.F. plasma chemical vapor processing Electricity 274 Expired
US4223048A Plasma enhanced chemical vapor processing of semiconductive wafers Electricity 84 Expired
US5763879A Diamond probe tip Emerging Cross-Sectional Technologies 59 Expired
US4590422A Automatic wafer prober having a probe scrub routine Physics 59 Expired
US4795977A Interface system for interfacing a device tester to a device under test Physics 56 Expired
US4736373A Memory tester having concurrent failure data readout and memory repair analysis Physics 56 Expired
US4460999A Memory tester having memory repair analysis under pattern generator control Physics 49 Expired
US4251772A Probe head for an automatic semiconductive wafer prober Physics 47 Expired
US4460997A Memory tester having memory repair analysis capability Physics 36 Expired
US4500836A Automatic wafer prober with programmable tester interface Physics 22 Expired
US4101761A Timing pulse generator Electricity 19 Expired
US4718202A Method and apparatus for rounding the edges of semiconductive wafers Performing Operations; Transporting 12 Expired
US4661033A Apparatus for unloading wafers from a hot boat Emerging Cross-Sectional Technologies 11 Expired
US4104867A Water-tight watch case Physics 8 Expired
US4249846A Rotary vacuum seal for a wafer transport system Emerging Cross-Sectional Technologies 6 Expired
US4820370A Particle shielded R. F. connector for a plasma enhanced chemical vapor processor boat Electricity 5 Expired
US4761301A Electrical insulator for a plasma enhanced chemical vapor processor Chemistry; Metallurgy 3 Expired
US4292722A Renewable nut for a lead screw drive and method of making same Emerging Cross-Sectional Technologies 2 Expired
US6448184B1 Formation of diamond particle interconnects Emerging Cross-Sectional Technologies 2 Expired

Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.