SEMICONDUCTOR TECHNOLOGIES & INSTRUMENTS PTE LTD
34Patents
15Active
34Granted
43Portfolio score
Filing activity: Feb 18, 1994 → Nov 8, 2019
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6118540A | Method and apparatus for inspecting a workpiece | Emerging Cross-Sectional Technologies | 49 | Expired |
| US6207946A | Adaptive lighting system and method for machine vision apparatus | Physics | 42 | Expired |
| US5956134A | Inspection system and method for leads of semiconductor devices | Electricity | 30 | Expired |
| US6252981A | System and method for selection of a reference die | Physics | 20 | Expired |
| US6765666B1 | System and method for inspecting bumped wafers | Physics | 9 | Expired |
| US5838434A | Semiconductor device lead calibration unit | Electricity | 9 | Expired |
| US5745593A | Method and system for inspecting integrated circuit lead burrs | Physics | 8 | Expired |
| US6128034A | High speed lead inspection system | Electricity | 7 | Expired |
| US6459807B1 | System and method for locating irregular edges in image data | Physics | 6 | Expired |
| US8885918B2 | System and method for inspecting a wafer | Electricity | 6 | Active |
| US6532063B1 | 3-D lead inspection | Physics | 5 | Expired |
| US9524897B2 | End handler for film and film frames and a method thereof | Electricity | 5 | Active |
| US6445518B1 | Three dimensional lead inspection system | Electricity | 4 | Expired |
| US5777886A | Programmable lead conditioner | Emerging Cross-Sectional Technologies | 4 | Expired |
| US6173632A | Single station cutting apparatus for separating semiconductor packages | Emerging Cross-Sectional Technologies | 4 | Expired |
| US9816938B2 | Apparatus and method for selectively inspecting component sidewalls | Electricity | 3 | Active |
| US6396578B2 | Post-seal inspection system and method | Physics | 2 | Expired |
| US5826630A | J-lead conditioning method and apparatus | Electricity | 2 | Expired |
| US11887876B2 | Component handler | Performing Operations; Transporting | 2 | Active |
| US10876975B2 | System and method for inspecting a wafer | Electricity | 2 | Active |
| US9863889B2 | System and method for inspecting a wafer | Electricity | 2 | Active |
| US6178861A | Single station cutting apparatus for separating semiconductor packages | Emerging Cross-Sectional Technologies | 1 | Expired |
| US8834091B2 | System and method using multiple component pane handlers configured to handle and transfer component panes | Electricity | 1 | Active |
| US10504761B2 | Method system for generating 3D composite images of objects and determining object properties based thereon | Physics | 1 | Active |
| US6259522A | Post-seal inspection system and method | Physics | 1 | Expired |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.