Akira Yonezawa
20Patents
9h-index
16Co-inventors
72Inventor score
Filing activity: Mar 28, 1979 → Dec 5, 2005
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5973395A | IC package having a single wiring sheet with a lead pattern disposed thereon | Electricity | 73 | Expired |
| US6351885B2 | Method of making conductive bump on wiring board | Emerging Cross-Sectional Technologies | 66 | Expired |
| US5950306A | Circuit board | Emerging Cross-Sectional Technologies | 27 | Expired |
| USD466554S1 | Tape transfer device | General | 25 | Expired |
| US6037589A | Electron beam device | Electricity | 24 | Expired |
| US4219732A | Magnetic electron lens | Electricity | 14 | Expired |
| US6243946A | Method of forming an interlayer connection structure | Emerging Cross-Sectional Technologies | 12 | Expired |
| US5241176A | Scanning electron beam microscope with high resolution at low accelerating voltage | Electricity | 12 | Expired |
| US6617579B2 | Scanning electronic beam apparatus | Electricity | 10 | Expired |
| US5023457A | Electron beam device | Electricity | 8 | Expired |
| US6504164B2 | Electron beam apparatus | Electricity | 8 | Expired |
| US6897450B2 | Electromagnetic field superimposed lens and electron beam device using this electromagnetic field superimposed lens | Electricity | 7 | Expired |
| US4961003A | Scanning electron beam apparatus | Electricity | 7 | Expired |
| US4434367A | Electron microscope | Electricity | 6 | Expired |
| US6949745B2 | Electron beam apparatus | Electricity | 5 | Expired |
| US4429222A | Transmission electron microscope | Electricity | 4 | Expired |
| US6740888B2 | Electron beam apparatus | Electricity | 4 | Expired |
| US7375328B2 | Charged particle beam apparatus and contamination removal method therefor | Electricity | 4 | Active |
| US4383176A | Objective lens for electron microscope | Electricity | 3 | Expired |
| US6335530B1 | Objective lens for scanning electron microscope | Electricity | 3 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.